FMR characterization of hexagonal arrays of Ni nanowires

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue III, 2004, Pages 1652-1653

  Ramos, C A ^a   Vazquez, M ^b   Nielsch, K ^c   Pirota, K ^b   Rivas, J ^d   Wehrspohn, R B ^e   Tovar, M ^a   Sanchez, R D ^a   Gosele U ^e  

^a INSTITUTO BALSEIRO   (Argentina)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

^e MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Anisotropy; FMR; Nanowires; Ni wires

Indexed keywords

ANISOTROPY; CRYSTAL STRUCTURE; DATA REDUCTION; FERROMAGNETIC RESONANCE; LIGHT SCATTERING; MAGNETIZATION; NICKEL; POLYMERIC MEMBRANES; SPECTROMETERS;

BRILLOUIN LIGHT SCATTERING; INTER-WIRE DISTANCES; NANOWIRES; NI WIRES;

NANOSTRUCTURED MATERIALS;

EID: 10844241236     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.12.233     Document Type: Conference Paper

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