Density off states determination from steady-state photocarrier grating measurements

Applied Physics Letters

Volumn 85, Issue 19, 2004, Pages 4412-4414

  Schmidt, J A ^a   Longeaud, C ^b  

^a UNIVERSIDAD NACIONAL DEL LITORAL   (Argentina)

^b UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; APPROXIMATION THEORY; COMPUTER SIMULATION; DIFFUSION; ELECTRIC FIELDS; ELECTRIC INSULATORS; FERMI LEVEL; HYDROGENATION; PHOTOCONDUCTIVITY; POISSON EQUATION;

DENSITY OF STATES (DOS); DIFFUSION COEFFICIENTS; PHOTOCONDUCTIVE INSULATORS; STEADY-STATE PHOTOCARRIER GRATING (SSPG) MEASUREMENTS;

CARRIER CONCENTRATION;

EID: 10844221527     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1818732     Document Type: Article

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