The value of preoperative tests in the selection of blind patients for a permanent microelectronic implant

Transactions of the American Ophthalmological Society

Volumn 101, Issue , 2003, Pages 223-230

  Yanai, Douglas ^a   Lakhanpal, Rohit R ^a   Weiland, James D ^a   Mahadevappa, Manjunatha ^a   Van Boemel, Gretchen ^a   Fujii, Gildo Y ^a   Greenberg, Robert ^b   Caffey, Sean ^a   De Juan Jr , Eugene ^a   Humayun, Mark S ^a   Puro, Donald G ^c   Wright, Kenneth W ^c   Gutman, Froncie A ^c   Knox, David L ^c  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

^b Second Sight LLC   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANALYZER; BLINDNESS; CLINICAL ARTICLE; COMPUTER PROGRAM; CONFERENCE PAPER; CONTROLLED STUDY; DARK ADAPTATION; ELECTRODE; ELECTROPHYSIOLOGY; ELECTRORETINOGRAM; EVOKED VISUAL RESPONSE; HUMAN; IMPLANT; MICROELECTRONIC RETINAL IMPLANT; MICROPROCESSOR; PATIENT SELECTION; PREOPERATIVE EVALUATION; PRIORITY JOURNAL; PSYCHOPHYSICS; SENSITIVITY AND SPECIFICITY; VISION; VISION TEST; VISUAL STIMULATION;

BLINDNESS; ELECTRORETINOGRAPHY; EVOKED POTENTIALS; HUMANS; MICROELECTRODES; PATIENT SELECTION; PREOPERATIVE CARE; PROSTHESES AND IMPLANTS; PSYCHOPHYSICS;

EID: 10744231253     PISSN: 00659533     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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