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Volumn 19, Issue 2, 2004, Pages 213-218
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Comparative secondary ion mass spectroscopy analysis of solar cell structures grown by pulsed laser ablation and ion sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
ION SPUTTERING;
SECONDARY ION MASS SPECTROSCOPY;
ATOMIC FORCE MICROSCOPY;
CADMIUM COMPOUNDS;
COMPOSITION;
CONTAMINATION;
GLASS;
GOLD COMPOUNDS;
GRAIN BOUNDARIES;
LASER ABLATION;
SOLAR CELLS;
SPECTROSCOPY;
SPUTTER DEPOSITION;
SURFACE ROUGHNESS;
SEMICONDUCTOR MATERIALS;
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EID: 10744224373
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/19/2/015 Document Type: Article |
Times cited : (10)
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References (9)
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