메뉴 건너뛰기




Volumn 473, Issue 2, 2005, Pages 196-200

Measuring film thickness using infrared imaging

Author keywords

Coatings; Surface roughness; Thermography; Thickness measurement

Indexed keywords

DYNAMIC LOADS; HEAT CONDUCTION; MATHEMATICAL MODELS; SPRAYED COATINGS; SURFACE ROUGHNESS; THERMOELASTICITY; THERMOGRAPHY (IMAGING); THICKNESS MEASUREMENT;

EID: 10644279882     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.04.058     Document Type: Article
Times cited : (13)

References (18)
  • 5
    • 10644249450 scopus 로고
    • ASTM, Stand. Des., D 1400 (1994) 135.
    • (1994) Stand. Des., D , vol.1400 , pp. 135
  • 6
    • 10644235094 scopus 로고    scopus 로고
    • ASTM, Stand. Des., E 376 (1996) 134.
    • (1996) Stand. Des., E , vol.376 , pp. 134
  • 7
    • 10644287235 scopus 로고    scopus 로고
    • ASTM, Stand. Des., B 567 (1997) 260.
    • (1997) Stand. Des., B , vol.567 , pp. 260
  • 8
    • 10644248533 scopus 로고    scopus 로고
    • ASTM, Stand. Des., B 568 (1997) 268.
    • (1997) Stand. Des., B , vol.568 , pp. 268
  • 15
    • 0002107946 scopus 로고
    • J. McKelvie, SPIE 731 (1987) 44.
    • (1987) SPIE , vol.731 , pp. 44
    • McKelvie, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.