High resolution X-ray image sensors based on HgI2

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4142, Issue , 2000, Pages 189-196

  Street, Robert A ^a   Mulato, Marcelo ^a   Ready, Steve E ^a   Lau, Rachel ^a   Ho, Jackson ^a   Van Schuylenbergh, Koenraad ^a   Schieber, Michael M ^b   Hermon, Haim ^b   Zuck, Asaf ^b   Vilensky, Alexander I ^b  

^a PALO ALTO RESEARCH CENTER   (United States)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

MERCURY COMPOUNDS; METALLIC FILMS; OPTICAL RESOLVING POWER; POLYCRYSTALLINE MATERIALS; RADIATION DETECTORS; X RAY RADIOGRAPHY;

POLYCRYSTALLINE FILMS; X RAY DETECTION;

IMAGE SENSORS;

EID: 10644253447     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.410562     Document Type: Article

References (0)