X-ray fluorescence analysis of geological samples: Exploring the effect of sample thickness on the accuracy of results

Applied Radiation and Isotopes

Volumn 62, Issue 3, 2005, Pages 501-508

  Al Merey, R ^a   Karajou, J ^a   Issa, H ^a  

^a Atomic Energy Commission   (Syrian Arab Republic)

Author keywords

Accuracy; Matrix effect; Sample thickness; X ray fluorescence spectrometry

Indexed keywords

GEOLOGICAL SAMPLES; X-RAY FLUORESCENCE;

ABSORPTION; CALCIUM; FLUORESCENCE; X RAYS;

GEOLOGY;

CALCIUM; SILICON;

ABSORPTION; ACCURACY; ARTICLE; CORRELATION ANALYSIS; GEOLOGY; PRIORITY JOURNAL; SAMPLING; SENSITIVITY ANALYSIS; X RAY FLUORESCENCE;

EID: 10644250040     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2004.04.020     Document Type: Article

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