Amorphous to polycrystalline transition in CoxSi1-x alloy thin films

European Physical Journal B

Volumn 41, Issue 4, 2004, Pages 517-524

  Velez M ^a   Meny C ^b   Valvidares, S M ^a   Diaz, J ^a   Morales, R ^a   Alvarez Prado, L M ^a   Panissod, P ^b   Alameda, J M ^a  

^a UNIVERSITY OF OVIEDO   (Spain)

^b INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; MAGNETIC ANISOTROPY; MAGNETOOPTICAL DEVICES; NUCLEAR MAGNETIC RESONANCE; POLYCRYSTALLINE MATERIALS; SEGREGATION (METALLOGRAPHY); THIN FILMS; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS AND QUASICRYSTALLINE MAGNETIC MATERIALS; MICROSCOPIC SEGREGATION; NUCLEAR MAGNETIC RESONANCE AND RELAXATION; SEMICONDUCTOR SYSTEMS;

COBALT ALLOYS;

EID: 10644244489     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2004-00345-0     Document Type: Article

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