Stability analysis of current programmed a-Si:H AMOLED pixel circuits

IEEE Transactions on Electron Devices

Volumn 51, Issue 12, 2004, Pages 2019-2025

  Sakariya, Kapil ^a   Servati, Peyman ^a   Nathan, Arokia ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Active matrix; Amorphous silicon; Current programmed pixel circuit; Organic light emitting diode (OLED); Thin film transistor (TFT); Threshold voltage shift

Indexed keywords

AMORPHOUS SILICON; DEGRADATION; ELECTRIC CURRENTS; INTEGRATED CIRCUIT LAYOUT; LIGHT EMITTING DIODES; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

ACTIVE MATRIX ORGANIC LIGHT EMITTING DIODE (AMOLED); CURRENT PROGRAMMED PIXEL CIRCUIT; PIXEL CIRCUITS; THRESHOLD VOLTAGE SHIFT;

THIN FILM CIRCUITS;

EID: 10644240902     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.838452     Document Type: Article

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