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Applied Physics A: Materials Science and Processing

Volumn 80, Issue 2, 2005, Pages 341-345

Stress effects in prism coupling measurements of thin polymer films

(4) Agan, S a Ay, F b Kocabas, A b Aydinli, A b

a KIRIKKALE UNIVERSITY (Turkey)

b BILKENT UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DIELECTRIC FILMS; LIGHT POLARIZATION; MICROMETERS; OPTICAL WAVEGUIDES; PRISMS; REFRACTIVE INDEX; STRESS ANALYSIS; THIN FILMS;

OPTICAL PARAMETERS; PRISM COUPLING MEASUREMENTS; STRESS EFFECTS; THIN POLYMER FILMS;

POLYMETHYL METHACRYLATES;

EID: 10644220312 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-003-2222-5 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.