Spectral quality metrics for VNIR and SWIR hyperspectral imagery

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5425, Issue , 2004, Pages 549-557

  Kerekes, John P ^a,b   Hsu, Su May ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b MIT LINCOLN LABORATORY   (United States)

Author keywords

Spectral imaging; Spectral quality

Indexed keywords

HYPERSPECTRAL IMAGERY; SPECTRAL IMAGING; SPECTRAL QUALITY;

ALGORITHMS; AUTOMATION; DATA REDUCTION; IMAGE QUALITY; OPTICAL RESOLVING POWER; PARAMETER ESTIMATION;

IMAGE PROCESSING;

EID: 10444283485     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.542192     Document Type: Conference Paper

References (9)

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