|
Volumn 42, Issue 9-11, 2002, Pages 1801-1806
|
Yield evaluation of gold sensor electrodes used for fully electronic DNA detection arrays on CMOS
b
November AG
(Germany)
c
SIEMENS AG
(Germany)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DNA;
ELECTRODES;
GOLD;
BACK-END MODULES;
DNA MOLECULES;
ELECTRONIC DNA DETECTION;
GOLD ELECTRODES;
SENSOR ELECTRODES;
SENSOR ELEMENTS;
STANDARD CMOS PROCESS;
TEST STRUCTURE;
CMOS INTEGRATED CIRCUITS;
|
EID: 10444280255
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-2714(02)00234-2 Document Type: Conference Paper |
Times cited : (9)
|
References (4)
|