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Volumn , Issue , 2004, Pages 846-851

Characterization of nanostructured and conventional cermet coatings by controlled scratch testing: Correlation with abrasion and hardness tests

(3)  Marple, B R a   Hawthorne, H M a   Xie, Y a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ABRASION; COBALT; ELECTRON BEAMS; HARDNESS; MECHANICAL TESTING; NANOSTRUCTURED MATERIALS; POWDERS; THICKNESS MEASUREMENT; TUNGSTEN CARBIDE; WEAR RESISTANCE;

EID: 10444275014     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (5)
  • 3
    • 0036352980 scopus 로고    scopus 로고
    • An attempt to evaluate the cohesion in WC/Co/Cr coatings by controlled scratching
    • Hawthorne, H.M. and Y. Xie: An attempt to evaluate the cohesion in WC/Co/Cr coatings by controlled scratching. Meccanica 36 (2001), pp. 675/82.
    • (2001) Meccanica , vol.36
    • Hawthorne, H.M.1    Xie, Y.2
  • 4
    • 0000202257 scopus 로고
    • Characterization of wear damage in coatings by optical profilometry
    • Dallaire, S., M. Dufour, and B. Gauthier: Characterization of wear damage in coatings by optical profilometry. Journal of Thermal Spray Technology 2 (1993), Number 4, pp. 363/68.
    • (1993) Journal of Thermal Spray Technology , vol.2 , Issue.4
    • Dallaire, S.1    Dufour, M.2    Gauthier, B.3
  • 5
    • 10444276018 scopus 로고    scopus 로고
    • Process temperature-hardness-wear relationships for HVOF-sprayed nanostructured and conventional cermet coatings
    • (Ed.) B. R. Marple and C. Moreau. ASM International, Materials Park, OH
    • Marple, B.R. and R.S. Lima: Process temperature-hardness-wear relationships for HVOF-sprayed nanostructured and conventional cermet coatings. Thermal Spray 2003: Advancing the Science and Applying the Technology, (Ed.) B. R. Marple and C. Moreau. ASM International, Materials Park, OH, (2003), pp. 273/82.
    • (2003) Thermal Spray 2003: Advancing the Science and Applying the Technology
    • Marple, B.R.1    Lima, R.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.