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Volumn 11, Issue 4, 2004, Pages 387-398

Fuzzy dynamic reliability evaluation of a deteriorating system under imperfect repair

Author keywords

'm' factor; Fuzzy Dynamic Reliability (FDRel); Fuzzy hazard rate; Initial Fuzzy Reliability Number (FIRN); PAR model; Probist system

Indexed keywords

CRACKS; FAILURE ANALYSIS; MATHEMATICAL MODELS; NUMBER THEORY; PROBABILITY; RELIABILITY; WEIBULL DISTRIBUTION;

EID: 10444269283     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539304001592     Document Type: Conference Paper
Times cited : (21)

References (12)
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    • (2001) Reliability Engineering and System Safety , vol.74 , pp. 89-97
    • Tsai, Y.-T.1    Wang, K.-S.2    Teng, H.-Y.3
  • 2
    • 0027233239 scopus 로고
    • A preliminary investigation of new mechanical product development based on reliability theory
    • K.-S. Wang, E.-H. Wan and W.-G. Yang, A preliminary investigation of new mechanical product development based on reliability theory, Reliability Engineering and System Safety 40 (1993) 187-194.
    • (1993) Reliability Engineering and System Safety , vol.40 , pp. 187-194
    • Wang, K.-S.1    Wan, E.-H.2    Yang, W.-G.3
  • 3
    • 0030196783 scopus 로고    scopus 로고
    • Dynamic reliability models for fatigue crack growth problem
    • K. S. Wang, S. T. Chang and Y. C. Shen, Dynamic reliability models for fatigue crack growth problem, Engineering Fracture Mechanics 54(4) (1996) 543-556.
    • (1996) Engineering Fracture Mechanics , vol.54 , Issue.4 , pp. 543-556
    • Wang, K.S.1    Chang, S.T.2    Shen, Y.C.3
  • 7
    • 0033117187 scopus 로고    scopus 로고
    • Age-dependent reliability model considering effects of maintenance and working conditions
    • S. Martorell, A. Sanchez and V. Serradell, Age-dependent reliability model considering effects of maintenance and working conditions, Reliability Engineering and System Safety 64 (1999) 19-31.
    • (1999) Reliability Engineering and System Safety , vol.64 , pp. 19-31
    • Martorell, S.1    Sanchez, A.2    Serradell, V.3
  • 8
    • 0027836620 scopus 로고
    • Fuzzy states as a basis for a theory of fuzzy reliability
    • K.-Y. Cai, C.-Y. Wen and M.-L. Zhang, Fuzzy states as a basis for a theory of fuzzy reliability, Microelectronics Reliability 33(15) (1993) 2253-2263.
    • (1993) Microelectronics Reliability , vol.33 , Issue.15 , pp. 2253-2263
    • Cai, K.-Y.1    Wen, C.-Y.2    Zhang, M.-L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.