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Volumn 53, Issue 3, 2005, Pages 801-810
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Effect of strain path on texture and annealing microstructure development in bulk pure copper processed by simple shear
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Author keywords
Copper; ECAE; Microhardness; Recrystallization; Texture
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Indexed keywords
ANNEALING;
DEFORMATION;
MICROSTRUCTURE;
PHASE SHIFT;
SHEAR STRESS;
STRAIN;
TEXTURES;
TWINNING;
HIGH CONDUCTIVITY COPPER;
STACKING FAULT ENERGY (SFE);
STRAIN PATH;
TEXTURE DEVELOPMENT;
COPPER;
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EID: 10444268206
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2004.10.032 Document Type: Article |
Times cited : (72)
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References (25)
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