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Volumn 33, Issue 5, 2004, Pages 731-735
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Progress and problems of High-k: materials
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Author keywords
Gate dielectric; High k materials; MOSFET; Thin films
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Indexed keywords
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EID: 10444265154
PISSN: 1000985X
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (23)
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