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Volumn 2, Issue , 2004, Pages 1506-1512

Effect of wafer level packaging, silicon substrate and board material on gigabit board-silicon-board data transmission

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DATA COMMUNICATION SYSTEMS; ELECTRIC LINES; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; PRINTED CIRCUIT BOARDS; SIGNAL PROCESSING; SILICON;

EID: 10444261949     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 1
    • 3843141819 scopus 로고    scopus 로고
    • Electrical design of wafer level packaging on board for gigabit data transmission
    • W. Kim, et al., "Electrical Design of Wafer Level Packaging on Board for Gigabit Data Transmission," Electronics Packaging Technology Conference, 2003.
    • (2003) Electronics Packaging Technology Conference
    • Kim, W.1
  • 2
    • 0036074081 scopus 로고    scopus 로고
    • Validity of non-physical RLGC models for simulating lossy transmission lines
    • W. Kim and M. Swaminathan, "Validity of Non-physical RLGC models for Simulating Lossy Transmission Lines," IEEE International Sym. Antennas and Propagation, pp. 786-789, 2002.
    • (2002) IEEE International Sym. Antennas and Propagation , pp. 786-789
    • Kim, W.1    Swaminathan, M.2
  • 7
    • 10444239710 scopus 로고    scopus 로고
    • The parasitic reactances of flip chip solder bumps
    • Unitive Inc.
    • G.A. Rinne and P.D. Rranzon, "The Parasitic Reactances of Flip Chip Solder Bumps," Unitive case studies, Unitive Inc.
    • Unitive Case Studies
    • Rinne, G.A.1    Rranzon, P.D.2
  • 9
    • 0042887576 scopus 로고    scopus 로고
    • Characterization and modeling of a new via structure in multilayered printed circuit boards
    • June
    • D. Kwon, et al., "Characterization and Modeling of a New Via Structure in Multilayered Printed Circuit Boards," IEEE Trans. Components and Packaging Technologies, vol. 26, No. 2, pp. 483-489, June 2003.
    • (2003) IEEE Trans. Components and Packaging Technologies , vol.26 , Issue.2 , pp. 483-489
    • Kwon, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.