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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5494, Issue , 2004, Pages 492-504

Cryogenic, high-accuracy, refraction measuring system (CHARMS) - A new facility for cryogenic infrared through far-ultraviolet refractive index measurements

(2) Leviton, Douglas B a Frey, Bradley J a

a NASA GODDARD SPACE FLIGHT CENTER (United States)

Author keywords

Cryogenic; Far ultraviolet; Infrared; Optical properties; Refractive index; Refractometer

Indexed keywords

FAR-ULTRAVIOLET REFRACTIVE INDEX MEASUREMENTS; IMAGE SENSOR ARRAYS; REFRACTION MEASURING SYSTEM;

IMAGE SENSORS; OPTICAL DESIGN; PRISMS; REFRACTION; REFRACTIVE INDEX; THERMAL EFFECTS; ULTRAVIOLET RADIATION;

CRYOGENICS;

EID: 10444261277 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.563795 Document Type: Conference Paper

Times cited : (32)

References (7)

1
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2
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- Technique for measuring the refractive index and its change with temperature in the infrared
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3
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- Waikoloa, August
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4
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- Cryogenic high-accuracy absolute prism refractometer for infrared through far-ultra-violet optical materials: Implementation and initial results
- San Diego, August
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- (2003) SPIE , vol.5172
- Frey, B.J.¹ Leviton, D.B.²

5
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- Ultra-high resolution, absolute, Cartesian electronic autocollimator
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- Leviton, D.B.¹

6
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- Thermal design considerations for the Cryogenic High Accuracy Refraction Measuring System (CHARMS)
- San Diego, August
- D.B. Leviton, B.J. Frey, "Thermal design considerations for the Cryogenic High Accuracy Refraction Measuring System (CHARMS)," SPIE 5172, San Diego, August 2003
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- Leviton, D.B.¹ Frey, B.J.²

7
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- Refractive index of the alkali halides and its wavelength and temperature derivatives
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- Li, H.H.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.