Epitaxial MgB2 thin films on ZrB2 buffer layers: Structural characterization by synchrotron radiation

Superconductor Science and Technology

Volumn 17, Issue 12, 2004, Pages 1434-1439

  Ferrando, V ^a   Tarantini, C ^a   Bellingeri, E ^a   Manfrinetti, P ^a   Pallecchi, I ^a   Marre D ^a   Plantevin, O ^b   Putti, M ^a   Felici, R ^b   Ferdeghini, C ^a  

^a Laboratory of Innovative and Artificial Materials Genoa   (Italy)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; INTERFACES (MATERIALS); MAGNESIUM COMPOUNDS; MAGNETIC FIELDS; PULSED LASER DEPOSITION; SYNCHROTRON RADIATION; ZIRCONIUM COMPOUNDS;

BUFFER LAYERS; CRITICAL FIELD MEASUREMENT; DIFFRACTION MEASUREMENT; TWO-STEP DEPOSITION PROCESS;

THIN FILMS;

EID: 10444259046     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/12/014     Document Type: Article

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