Microinfrared reflection spectroscopic mapping: Application to the detection of hydrogen-related species in natural quartz

Journal of Microscopy

Volumn 216, Issue 3, 2004, Pages 222-228

  Muto, J ^a   Nagahama, H ^a   Hashimoto, T ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b NIIGATA UNIVERSITY   (Japan)

Author keywords

Hydrolytic weakening; Microinfrared reflection spectroscopic mapping; Natural quartz; SiH; SiOH

Indexed keywords

ABSORPTION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN BOUNDARIES; HYDROGEN; INFRARED ABSORPTION; INFRARED REFLECTION; POINT DEFECTS; QUARTZ; SPECTROMETERS; SPECTROSCOPIC ANALYSIS;

FOURIER TRANSFORM INFRARED SPECTROMETER; GRAIN-BOUNDARIES; HYDROLYTIC WEAKENING; MAPPING ANALYSIS; MAPPING APPLICATIONS; MICROINFRARED REFLECTION SPECTROSCOPIC MAPPING; NATURAL QUARTZ; REFLECTION MAPPING; REFLECTION SPECTROSCOPY; SPECTROSCOPIC MAPPING;

LIGHT ABSORPTION;

HYDROGEN; LIQUID NITROGEN; SILICON DERIVATIVE; SILICON DIOXIDE; WATER;

ABSORPTION SPECTROSCOPY; ARTICLE; CHEMICAL STRUCTURE; COMPUTER MEMORY; GRAIN; HYDROLYSIS; IMAGING SYSTEM; INFRARED SPECTROSCOPY; LOW TEMPERATURE; MICROINFRARED REFLECTION SPECTROSCOPIC MAPPING; MICROSCOPY; PRIORITY JOURNAL; ROOM TEMPERATURE; SPECTROSCOPY;

EID: 10444254740     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01419.x     Document Type: Article

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