Surface structure of low-coveraged Cs on Si(001)-(2×1) system

Applied Surface Science

Volumn 240, Issue 1-4, 2005, Pages 305-311

  Park, J Y ^a   Seo, J H ^a   Kim, J Y ^a   Whang, C N ^a   Kim, S S ^b   Choi, D S ^c   Chae, K H ^d  

^a Yonsei University   (South Korea)

^b Mokwon University   (South Korea)

^c Kangwon National University   (South Korea)

^d Korea Institute of Science and Technology   (South Korea)

Author keywords

Alkali metals; Cesium; Low energy ion scattering (LEIS); Morphology; Roughness and topography; Silicon; Surface structure

Indexed keywords

ADSORPTION; ALKALI METALS; CATHODES; CESIUM; DIMERS; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); MORPHOLOGY; SEMICONDUCTOR MATERIALS; SILICON;

ATOMIC STRUCTURES; ELECTRON AFFINITY CATHODES; LOW ENERGY ION SCATTERING (LEIS); ROUGHNESS AND TOPOGRAPHY;

SURFACE STRUCTURE;

EID: 10444250327     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.06.144     Document Type: Article

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