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Volumn E87-C, Issue 11, 2004, Pages 1769-1776

Design and application of ferroelectric memory based nonvolatile SRAM

Author keywords

Ferroelectric material; Nonvolatile memory; Programmable logic devices; Programming; SoC

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC SWITCHES; FERROELECTRIC MATERIALS; LOGIC DEVICES; MICROPROCESSOR CHIPS; SILICON; STATIC RANDOM ACCESS STORAGE;

EID: 10444241773     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (12)

References (13)
  • 1
    • 0036105656 scopus 로고    scopus 로고
    • Technology in the Internet age
    • Feb.
    • D. Buss, "Technology in the Internet age," ISSCC, pp.18-21, Feb. 2002.
    • (2002) ISSCC , pp. 18-21
    • Buss, D.1
  • 2
    • 0036923406 scopus 로고    scopus 로고
    • 4 Mbit embedded FRAM for high performance system on chip (SoC) with large switching charge, reliable retention and high imprint resistance
    • Dec.
    • Y. Horii, Y. Hikosaka, A. Itoh, K. Matsuura, M. Kurasawa, G. Komuro, T. Eshita, and S. Kashiwagi, "4 Mbit embedded FRAM for high performance system on chip (SoC) with large switching charge, reliable retention and high imprint resistance," IEDM, pp.539-542, Dec. 2002.
    • (2002) IEDM , pp. 539-542
    • Horii, Y.1    Hikosaka, Y.2    Itoh, A.3    Matsuura, K.4    Kurasawa, M.5    Komuro, G.6    Eshita, T.7    Kashiwagi, S.8
  • 10
    • 0037346055 scopus 로고    scopus 로고
    • A current-based reference-generation scheme for 1T-1C ferroelectric random-access memories
    • March
    • J. Siu, Y. Eslami, A. Sheikholeslami, G. Gulak, T. Endo, and S. Kawashima, "A current-based reference-generation scheme for 1T-1C ferroelectric random-access memories," IEEE J. Solid-State Circuits, vol.36, no.3, pp.667-677, March 2003.
    • (2003) IEEE J. Solid-state Circuits , vol.36 , Issue.3 , pp. 667-677
    • Siu, J.1    Eslami, Y.2    Sheikholeslami, A.3    Gulak, G.4    Endo, T.5    Kawashima, S.6
  • 11
    • 12744277440 scopus 로고    scopus 로고
    • Analysis of ferroelectric microcapacitors by scanning probe microscope
    • N. Kin and K. Honda, "Analysis of ferroelectric microcapacitors by scanning probe microscope," Proc. MRS Spring Meeting 2004, pp.D.3.28.1-5, 2004.
    • (2004) Proc. MRS Spring Meeting 2004
    • Kin, N.1    Honda, K.2
  • 13
    • 0031332801 scopus 로고    scopus 로고
    • Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation
    • S. Traynor, T. Hadnagy, and L. Kammerdiner, "Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation," Integrated Ferroelectrics, pp.63-76, 1997.
    • (1997) Integrated Ferroelectrics , pp. 63-76
    • Traynor, S.1    Hadnagy, T.2    Kammerdiner, L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.