Determination of the modulated structure of the misfit layer compound (LaS)1.196VS2

Materials Research Bulletin

Volumn 40, Issue 1, 2005, Pages 125-133

  Cario, Laurent ^a   Meerschaut, Alain ^a   Corraze, Benoît ^a   Chauvet, Olivier ^a  

^a INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

A. Chalcog nides; A. Composites; A. Layered compounds; C. X ray diffraction; D. Crystal structure

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; DIFFRACTION; DISLOCATIONS (CRYSTALS); MICROANALYSIS; POWDERS; X RAY DIFFRACTION;

CHALCOGENIDES; LAYERED COMPOUNDS; MISFIT LAYERED COMPOUNDS;

LANTHANUM COMPOUNDS;

EID: 10444239453     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2004.09.002     Document Type: Article

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