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Volumn 5496, Issue , 2004, Pages 738-746
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Image analysis algorithms for critically sampled curvature wavefront sensor images in the presence of large intrinsic aberrations
a a b a c |
Author keywords
Active optics; Curvature wavefront sensor; Image analysis; Simplex; VISTA
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Indexed keywords
ABERRATIONS;
ALGORITHMS;
CHARGE COUPLED DEVICES;
FUNCTIONS;
IMAGE SENSORS;
OPTICAL TELESCOPES;
ACTIVE OPTICS;
CURVATURE WAVEFRONT SENSORS;
VISTA;
IMAGE ANALYSIS;
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EID: 10444236735
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.550063 Document Type: Conference Paper |
Times cited : (8)
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References (6)
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