Calibration of near field measurements using microstrip line for noise predictions

Proceedings - Electronic Components and Technology Conference

Volumn 2, Issue , 2004, Pages 1432-1436

  Srinivasan, Krishna ^a   Sasaki, Hideki ^b   Swaminathan, Madhavan ^a   Tummala, Rao ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b NEC CORPORATION   (Japan)

Author keywords

Microstrip; Near field scanning; Numerical Modeling

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETISM; MAGNETIC FIELDS; MICROELECTRONICS; PERMITTIVITY; SIGNAL INTERFERENCE; SIGNAL PROCESSING; SPURIOUS SIGNAL NOISE;

ELECTROMAGNETIC COUPLING; MICROSTRIP; MIXED SIGNAL CIRCUITS; NEAR FIELD SCANNING; NUMERICAL MODELING;

MICROSTRIP LINES;

EID: 10444233536     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. L. Zhang et. al., "Field Extraction from Near Field Scanning for a Microstrip Structure", in International Symposium on Electromagnetic Compatibility, August 2002, vol. 2, pp. 589-592.
2. N. Masuda et. al., "Development of a System for Measuring High-Frequency Magnetic Fields and Currents of LSIs and PCBs", [Online Document], [cited 06 Jan 2004], Available Online: http://www.nec.co.jp/techrep/en/r_and_d/r03/r03-no3/rd07.pdf
3. M. N. O. Sadiku, Elements of Electromagnetics, 3rd ed. New York: Oxford University Press, 2001.