Investigation of carrier transport and trapping by oxygen-related defects in MEH-PPV diodes

Semiconductor Science and Technology

Volumn 19, Issue 12, 2004, Pages 1373-1380

  Kazukauskas V ^a  

^a VILNIUS UNIVERSITY   (Lithuania)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CHEMICAL REACTIONS; DEPOLYMERIZATION; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRIC POTENTIAL; SCHOTTKY BARRIER DIODES; THERMAL EFFECTS;

CARRIER TRANSPORT; GLASS-TRANSITION TEMPERATURE; MEH-PPV DIODES; OXYGEN-RELATED DEFECTS;

OXYGEN;

EID: 10444225863     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/19/12/008     Document Type: Article

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