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Volumn 5496, Issue , 2004, Pages 506-517

Slitmasks from observer to telescope: Astrometric slitmask manufacturing and control for Keck spectrographs

Author keywords

Astrometric; Configuration; Database; Process control; Quality control; Slitmask

Indexed keywords

BAR CODES; COMPUTATIONAL COMPLEXITY; DATA ACQUISITION; DATABASE SYSTEMS; PROBLEM SOLVING; PROCESS CONTROL; QUALITY CONTROL; SPECTROGRAPHS;

EID: 10444223339     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.552300     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 3
  • 9
    • 12344278708 scopus 로고    scopus 로고
    • The official Pad++ home page http://www.cs.umd.edu/hcil/pad++/ offers an overview plus several online papers.
    • The Official Pad++ Home Page
  • 10
    • 12344324400 scopus 로고    scopus 로고
    • The official CGItcl home page http://expect.nist.gov/cgi.tcl/ offers an overview, documents, and examples.
    • The Official CGItcl Home Page


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.