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Volumn 5496, Issue , 2004, Pages 506-517
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Slitmasks from observer to telescope: Astrometric slitmask manufacturing and control for Keck spectrographs
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Author keywords
Astrometric; Configuration; Database; Process control; Quality control; Slitmask
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Indexed keywords
BAR CODES;
COMPUTATIONAL COMPLEXITY;
DATA ACQUISITION;
DATABASE SYSTEMS;
PROBLEM SOLVING;
PROCESS CONTROL;
QUALITY CONTROL;
SPECTROGRAPHS;
ASTROMETRIC;
CONFIGURATION;
SLITMASK;
TELESCOPES;
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EID: 10444223339
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.552300 Document Type: Conference Paper |
Times cited : (1)
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References (10)
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