Structure and microstructural characteristics in the thin films of La 1-xSrxMnO3 (x = 0.1, 0.2, 0.3)

Materials Letters

Volumn 58, Issue 9, 2004, Pages 1485-1489

  Zhu, Y L ^a   Ma, X L ^a   Zhang, M ^a   Li, D X ^a   Lu, H B ^b   Chen, Z H ^b   Yang, G Z ^b  

^a INSTITUTE OF METAL RESEARCH   (China)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

Electron diffraction; La1 xSrxMnO3; Transmission electron microscopy

Indexed keywords

DOPING (ADDITIVES); ELECTRON DIFFRACTION; IMAGING SYSTEMS; LASER APPLICATIONS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; PEROVSKITE; RELAXATION PROCESSES; STRONTIUM COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

LA1-XSRXMNO3; RHOMBOHEDRAL DOMAINS;

LANTHANUM COMPOUNDS;

EID: 1042292757     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2003.10.015     Document Type: Article

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