Future of testing: Reintegration of design, testing and manufacturing

Proceedings of the 1996 European Conference on Design and Test, EDTC 1996

Volumn , Issue , 1996, Pages xix-xxii

  Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS INDUSTRY; EQUIPMENT; MANUFACTURE; MICROELECTRONICS; TRANSISTORS;

COST OF MANUFACTURING; EQUIPMENT INDUSTRIES; MANUFACTURING EQUIPMENT; MANUFACTURING PROCESS; SEMICONDUCTOR INDUSTRY; SEMICONDUCTOR INDUSTRY ASSOCIATIONS; SUBMICRON TECHNOLOGIES; TECHNOLOGY DEVELOPMENT; DESIGN AND TESTS; MOORE'S LAW;

SEMICONDUCTOR DEVICE MANUFACTURE; MANUFACTURE;

EID: 1042289248     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDTC.1996.494116     Document Type: Conference Paper

References (10)

1. G. Moore, "VLSI: Some Fundamental Changes, " IEEE Spectrum, Vol. 16, No. 4, 1979, pp. 79-37.
2. W. Maly, "Cost of Silicon Viewed from VLSI Design Perspective", Proc. of DAC-94, San Diego, June 1994, pp. 135-142.
3. The National Technology Roadmap for Semiconductors -Semiconductor Industry Association, 1994.
4. M. Splinter, Keynote: "Semiconductor Manufacturing comes of Age, " SEMI Advanced Semiconductor Manufacturing Conference, Boston, November 1995.
5. B. McClean, Editor, "Mid-Term 1995 Status and Forecast of the IC, " Integrated Circuit Engineering Corporation.
6. S. Bruederle, "Water Fab Equipment: Are We Ready to Call the Silicon Cycle Dead?" SEMI Advanced Semiconductor Manufacturing Conference, Boston, November 1995.
7. M.E. Thomas, "Review of NTRS Interconnect Roadmap." SEMI Advanced Semiconductor Manufacturing Conference, Boston, November 1995.
8. R. Leckie, Private Communication.
9. K.M. Thompson, "Intel and the Myths of Test, " Keynote at ITC 95.
10. W. Maly, "Integration of Design, Manufacturing and Testing, " IEEE International Test Conference, October 1994, pp. 1017.