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Volumn 25, Issue 1, 2004, Pages 326-329
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High-Throughput Chemical Vapor Deposition System and Thin-Film Silicon Library
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Author keywords
Hot wire chemical vapor deposition (HWCVD); Hydrogenated amorphous silicon (a Si:H); Microcrystalline silicon ( c Si); Raman spectroscopy; Thin films
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
GLASS;
HYDROGEN;
SILANES;
SUBSTRATES;
THIN FILMS;
MICROCRYSTALLINE MATERIALS;
SILICON;
HYDROGEN;
SILANE;
SILICON;
ARTICLE;
CHEMICAL STRUCTURE;
CRYSTAL STRUCTURE;
FILM;
HIGH THROUGHPUT SCREENING;
HYDROGENATION;
RAMAN SPECTROMETRY;
REACTION ANALYSIS;
STRUCTURE ANALYSIS;
TECHNIQUE;
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EID: 1042281055
PISSN: 10221336
EISSN: None
Source Type: Journal
DOI: 10.1002/marc.200300151 Document Type: Article |
Times cited : (12)
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References (20)
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