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Volumn 72, Issue 2, 2004, Pages 159-163

Resolution enhancement by dithering

Author keywords

[No Author keywords available]

Indexed keywords


EID: 1042279744     PISSN: 00029505     EISSN: None     Source Type: Journal    
DOI: 10.1119/1.1613274     Document Type: Article
Times cited : (8)

References (18)
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  • 4
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    • Dither signals and their effect on quantization noise
    • L. Schuchman, "Dither signals and their effect on quantization noise," IEEE Trans. Commun. Technol. COM-12, 162-165 (1964).
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  • 5
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    • Digital processing in an analog world: Dithering your conversion
    • D. Tweed, "Digital processing in an analog world: Dithering your conversion," Circuit Cellar INK 101, 68-72 (1998), or 〈http://www.dtweed.com〉.
    • (1998) Circuit Cellar INK , vol.101 , pp. 68-72
    • Tweed, D.1
  • 7
    • 33751512263 scopus 로고
    • Spectra of quantized signals
    • W. R. Bennet, "Spectra of quantized signals," Bell Syst. Tech. J. 27, 446-472 (1948).
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    • Bennet, W.R.1
  • 8
    • 0001329086 scopus 로고
    • Statistical analysis of amplitude quantized sampled-data systems
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    • Widrow, B.1
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    • Picture coding using pseudo-random noise
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  • 10
    • 0000381654 scopus 로고
    • Stochastic resonance and the dithering effect in threshold physical systems
    • L. Gammaitoni, "Stochastic resonance and the dithering effect in threshold physical systems," Phys. Rev. E 52, 4691-4698 (1995).
    • (1995) Phys. Rev. E , vol.52 , pp. 4691-4698
    • Gammaitoni, L.1
  • 12
    • 0000661933 scopus 로고    scopus 로고
    • Suprathreshold stochastic resonance in multilevel threshold systems
    • N. G. Stocks, "Suprathreshold stochastic resonance in multilevel threshold systems," Phys. Rev. Lett. 84, 2310-2313 (2000).
    • (2000) Phys. Rev. Lett. , vol.84 , pp. 2310-2313
    • Stocks, N.G.1
  • 13
    • 34248175424 scopus 로고    scopus 로고
    • Reducing the effects of noise in a data acquisition system by averaging
    • AN152, National Instruments, National Instruments
    • E. B. Loewenstein, "Reducing the effects of noise in a data acquisition system by averaging," AN152, National Instruments "6023E/6024E/6025E User's Manual," National Instruments, 2000, 〈http://www.ni.com〉; "Enhanced resolution in LeCroy digital oscilloscopes," Application Notes, LeCroy, 〈http://www.lecroy.com〉; "TDS500 Series Digital Phosphor Oscilloscopes," User's Manual, Tektronix, 〈http://www.tektronix.com〉.
    • (2000) 6023E/6024E/6025E User's Manual
    • Loewenstein, E.B.1
  • 14
    • 33646669236 scopus 로고    scopus 로고
    • Enhanced resolution in Lecroy digital oscilloscopes
    • LeCroy
    • E. B. Loewenstein, "Reducing the effects of noise in a data acquisition system by averaging," AN152, National Instruments "6023E/6024E/6025E User's Manual," National Instruments, 2000, 〈http://www.ni.com〉; "Enhanced resolution in LeCroy digital oscilloscopes," Application Notes, LeCroy, 〈http://www.lecroy.com〉; "TDS500 Series Digital Phosphor Oscilloscopes," User's Manual, Tektronix, 〈http://www.tektronix.com〉.
    • Application Notes
  • 15
    • 33646669427 scopus 로고    scopus 로고
    • Tds500 Series Digital Phosphor Oscilloscopes
    • Tektronix
    • E. B. Loewenstein, "Reducing the effects of noise in a data acquisition system by averaging," AN152, National Instruments "6023E/6024E/6025E User's Manual," National Instruments, 2000, 〈http://www.ni.com〉; "Enhanced resolution in LeCroy digital oscilloscopes," Application Notes, LeCroy, 〈http://www.lecroy.com〉; "TDS500 Series Digital Phosphor Oscilloscopes," User's Manual, Tektronix, 〈http://www.tektronix.com〉.
    • User's Manual
  • 17
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    • Systematic errors, statistical errors: A demonstrative experience
    • J. M. Simon, M. C. Simon, and C. E. Vanney, "Systematic errors, statistical errors: A demonstrative experience," Anales AFA 5, 1-4 (1993).
    • (1993) Anales AFA , vol.5 , pp. 1-4
    • Simon, J.M.1    Simon, M.C.2    Vanney, C.E.3
  • 18
    • 33646667545 scopus 로고    scopus 로고
    • Reference 2, Sec. 4, p. 57
    • Reference 2, Sec. 4, p. 57.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.