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Volumn 102, Issue 14, 1998, Pages 2519-2522

In situ X-ray absorption of a carbon monoxide-iron porphyrin adduct adsorbed on high-area carbon in an aqueous electrolyte

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EID: 1042276677     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp973124f     Document Type: Article
Times cited : (23)

References (21)
  • 1
    • 0002795804 scopus 로고
    • See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
    • (1977) J. Electroanal. Chem. , vol.83 , pp. 207-213
    • Zagal, J.1    Sen, R.K.2    Yeager, E.B.3
  • 2
    • 0019035244 scopus 로고
    • See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
    • (1980) J. Electrochem. Soc. , vol.127 , pp. 1506-1517
    • Zagal, J.1    Bindra, P.2    Yeager, E.B.3
  • 3
    • 33847085492 scopus 로고
    • See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
    • (1980) J. Am. Chem. Soc. , vol.102 , pp. 6027-6036
    • Collman, J.P.1    Denisevich, P.2    Konai, Y.3    Marrocco, M.4    Koval, C.5    Anson, F.C.6
  • 4
    • 0000950118 scopus 로고
    • See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
    • (1982) J. Phys. Chem. , vol.86 , pp. 2776-2783
    • Shigehara, K.1    Anson, F.C.2
  • 5
    • 0020618154 scopus 로고
    • See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
    • (1983) J. Am. Chem. Soc. , vol.105 , pp. 2710-2718
    • Durand Jr., R.R.1    Bencosme, C.S.2    Collman, J.P.3    Anson, F.C.4
  • 6
    • 0001306168 scopus 로고
    • See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
    • (1987) J. Phys. Chem. , vol.91 , pp. 3799
    • Tanaka, A.A.1    Fierro, C.2    Yeager, E.B.3    Scherson, D.4
  • 7
    • 0024699010 scopus 로고
    • See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
    • (1989) Mater. Chem. Phys. , vol.22 , pp. 431-456
    • Tanaka, A.A.1    Fierro, C.2    Scherson, D.A.3    Yeager, E.B.4


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