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Zagal, J.1
Sen, R.K.2
Yeager, E.B.3
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See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
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Zagal, J.1
Bindra, P.2
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33847085492
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See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
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Collman, J.P.1
Denisevich, P.2
Konai, Y.3
Marrocco, M.4
Koval, C.5
Anson, F.C.6
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0000950118
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See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
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Shigehara, K.1
Anson, F.C.2
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See, for example, the following. (a) Zagal, J.; Sen, R. K.; Yeager, E. B. J. Electroanal. Chem. 1977, 83, 207-213. (b) Zagal, J.; Bindra, P.; Yeager, E. B. J. Electrochem. Soc. 1980, 127, 1506-1517. (c) Collman, J. P.; Denisevich, P.; Konai, Y.; Marrocco, M.; Koval, C.; Anson, F. C. J. Am. Chem. Soc. 1980, 102, 6027-6036. (d) Shigehara, K.; Anson, F. C. J. Phys. Chem. 1982, 86, 2776-2783. (e) Durand, R. R., Jr.; Bencosme, C. S.; Collman, J. P.; Anson, F. C. J. Am. Chem. Soc. 1983, 105, 2710-2718. (f) Tanaka, A. A.; Fierro, C.; Yeager, E. B.; Scherson, D. J. Phys. Chem. 1987, 91, 3799. (g) Tanaka, A. A.; Fierro, C.; Scherson, D. A.; Yeager, E. B. Mater. Chem. Phys. 1989, 22, 431-456.
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