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Volumn 449, Issue 1-2, 2004, Pages 138-146
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Ellipsometric study of WO3 films dissolution in aqueous solutions
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Author keywords
Dissolution; Ellipsometry; WO3 films
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Indexed keywords
CAPACITANCE MEASUREMENT;
DISSOLUTION;
ELECTRIC FIELD EFFECTS;
ELECTROCHEMICAL ELECTRODES;
ELLIPSOMETRY;
EROSION;
FILM GROWTH;
HYDRATION;
PERMITTIVITY;
POLYCRYSTALLINE MATERIALS;
POROSITY;
SURFACE ROUGHNESS;
THICKNESS MEASUREMENT;
TUNGSTEN COMPOUNDS;
FILM THICKNESS;
VACUUM PERMITTIVITY;
THIN FILMS;
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EID: 1042269665
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2003.10.156 Document Type: Article |
Times cited : (15)
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References (42)
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