Computer simulation of time-of-flight mass spectrometers: Calculations of mass spectra and spatial distributions of ions

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 519, Issue 1-2, 2004, Pages 345-352

  Veryovkin, Igor V ^a   Chen, Chun Yen ^b   Calaway, Wallis F ^a   Pellin, Michael J ^a   Lee, Typhoon ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b INSTITUTE OF EARTH SCIENCES   (Taiwan)

Author keywords

Ion optics; SIMION; Time of flight mass spectrometry

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; COMPUTER SOFTWARE; DATABASE SYSTEMS; IONIZATION; KINETIC ENERGY; MASS SPECTROMETERS; MASS SPECTROMETRY; OPTICAL SYSTEMS; PARTICLE OPTICS; TARGETS;

ION OPTICS; SIMION; TIME-OF-FLIGHT MASS SPECTROMETRY;

NUCLEAR PHYSICS;

EID: 1042269585     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.172     Document Type: Conference Paper

References (6)

1. D.A. Dahl, SIMION 3D Version 6.0. 43rd ASMS Conference on Mass Spectrometry and Allied Topics, May 21-26 1995, Atlanta, Georgia, p. 717.
2. I.V. Veryovkin, W.F. Calaway, M.J. Pellin, Ion Optics of a New Time-Of-Flight Mass Spectrometer For Quantitative Surface Analysis, Proceedings of CPO-6, Nucl. Instr. and Meth. A, 2004, these Proceedings.
3. Sigmund P. Behrisch R. Sputtering by Particle Bombardment I. 1981;9 Springer, Berlin, Heidelberg, New York.
4. Betz G., Wien K. Int. J. Mass Spectrom. Ion Proc. 140:1994;1.
5. M.J. Pellin, W.F. Calaway, I.V. Veryovkin, in: J. Vickerman, D. Briggs (Eds.), ToF-SIMS: Surface Analysis by Mass Spectrometry, Surface Spectra Ltd., Manchester, and IM Publications, Chichester, 2001, p. 375.
6. I.V. Veryovkin, W.F. Calaway, M.J. Pellin, A Virtual Reality Instrument: Near-Future Perspective of Computer Simulations of Ion optics, Proceedings of CPO-6, Nucl. Instr. and Meth. A, 2004, these Proceedings.