Method of the ratio of envelopes of the reflection spectrum for measuring optical constants and thickness of thin films

Optika i Spektroskopiya

Volumn 88, Issue 4, 2000, Pages 641-646

  Filippov, V V ^a  

^a NONE

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EID: 10344252696     PISSN: 00304034     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

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