New hermetic sample holder for radioactive materials fitting to Siemens D5000 and Bruker D8 X-ray diffractometers: Application to the Rietveld analysis of plutonium dioxide

Journal of Applied Crystallography

Volumn 37, Issue 6, 2004, Pages 1034-1037

  Belin, Renaud C ^a   Valenza, Philippe J ^a   Reynayd, Muriel A ^a   Raison, Philippe E ^b  

^a IRFM   (France)

^b TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

PLUTONIUM DIOXIDE; PLUTONIUM DIOXIDE PU 239; RADIOACTIVE MATERIAL; UNCLASSIFIED DRUG;

ARTICLE; BRAGG BRENTANO GEOMETRY; DATA ANALYSIS; DIAGNOSTIC ACCURACY; DIFFRACTION; GEOMETRY; MATHEMATICAL ANALYSIS; PUBLICATION; RELIABILITY; RIETVELD ANALYSIS; SAMPLING; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 10344245496     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804022885     Document Type: Article

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