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Volumn 20, Issue 6, 2004, Pages 138-
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Method for classification of apple surface defect based on digital image processing
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 10344234272
PISSN: 10026819
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (7)
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References (0)
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