Isotopic analysis of 28Si-enriched silicon using laser mass spectrometry

Journal of Analytical Chemistry

Volumn 56, Issue 5, 2001, Pages 437-442

  Kovalev, I D ^a   Malyshev, K N ^a   Potapov, A M ^a   Suchkov, A I ^a  

^a INSTITUTE OF CHEMISTRY OF HIGH PURITY SUBSTANCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; CHEMICAL STRUCTURE; FILM; ISOTOPE ANALYSIS; MASS SPECTROMETRY; NEBULIZATION; SOLID STATE; STRUCTURE ANALYSIS;

EID: 10244261600     PISSN: 10619348     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1016674919374     Document Type: Article

References (11)

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