Sequential diagnosis of processor array systems

IEEE Transactions on Reliability

Volumn 53, Issue 4, 2004, Pages 487-498

  Zhao, Jun ^a   Meyer, Fred J ^b   Park, Nohpill ^c   Lombardi, Fabrizio ^d  

^a Lattice Semiconductor   (United States)

^b Wichita State University   (United States)

^c Oklahoma State University   (United States)

^d Northeastern University   (United States)

Author keywords

Homogeneous system; PMC model; Regular array; Repair; Sequential diagnosis

Indexed keywords

ALGORITHMS; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; OPTIMIZATION; REPAIR; SYSTEMS ANALYSIS;

DIAGNOSABILITY; HOMOGENOUS SYSTEM; REGULAR ARRAY; SEQUENTIAL DIAGNOSIS;

PARALLEL PROCESSING SYSTEMS;

EID: 10244240511     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2004.837528     Document Type: Article

References (21)

1. L. Baldelli and P. Maestrini, "Diagnosis of processor arrays," in 24th Fault-Tolerant Computing Symp., June 1994, pp. 48-54.
2. F. Barsi et al., "A theory of diagnosability of digital systems," IEEE Trans. Comput., vol. 25, pp. 585-593, 1976.
3. M. L. Blount, "Probabilistic treatment of diagnosis in digital systems," in 7th Fault-Tolerant Computing Symp., 1977, pp. 72-77.
4. 2.5 fault identification algorithm for diagnosable systems," IEEE Trans. Comput., vol. 33, pp. 486-492, 1984.
5. A. T. Dahbura et al., "The comparison approach to multiprocessor fault diagnosis," in 15th IEEE Fault-Tolerant Computing Symp., Ann Arbor, MI, June 1985, pp. 260-265.
6. C. Feng et al., "An adaptive system-level diagnosis approach for mesh connected multiprocessors," in Int. Conf. Parallel Processing College Station, PA, Aug. 1993.
7. C. S. Holt and J. E. Smith, "Self-diagnosis in distributed systems," IEEE Trans. Comput., vol. 34, pp. 19-31, 1985.
8. S. H. Hosseini et al., "On self-fault diagnosis of the distributed systems," IEEE Trans. Comput., vol. 37, no. 2, pp. 248-251, Feb. 1988.
9. K. Huang et al., "A diagnosis algorithm for constant degree structures and its application to VLSI circuit testing," IEEE Trans. Parallel Distrib. Syst., vol. 6, no. 4, pp. 363 372, Apr. 1995.
10. S. Khanna and W. K. Fuchs, "A graph partitioning approach to sequential diagnosis," IEEE Trans. Comput., vol. 48, no. 1, pp. 39-47, Jan. 1997.
11. S. E. Kreutzer and S. L. Hakimi, "Distributed diagnosis and the system user," IEEE Trans. Comput., vol. 37, pp. 71-78, 1988.
12. J. G. Kuhl and S. M. Reddy, "Distributed fault-tolerance for large multiprocessor systems," in 7th Annu. Symp. Computer Architecture May 1980, pp. 23-30.
13. L. E. LaForge, "Feasible regions quantify the probabilistic configuration power of arrays with multiple fault types," in 8th Innovative Systems in Silicon Conf., Austin, TX, Oct. 1996, pp. 298-312.
14. L. E. LaForge et al., "Almost sure diagnosis of almost every good element," IEEE Trans. Comput., vol. 43, no. 3, pp. 295-305, Mar. 1994.
15. J. Maeng and M. Malek, "A comparison connection assignment for self-diagnosis of multiprocessor systems," IEEE Trans. Comput., vol. 30, pp. 173-175, 1981.
16. F. P. Preparata et al., "On the connection assignment problem of diagnosable systems," IEEE Trans. Electron. Comput., vol. 16, pp. 848-854, 1967.
17. V. Raghavan and A. Tripathi, "Improved diagnosability algorithms," IEEE Trans. Comput., vol. 40, pp. 142-153, 1991.
18. V. Raghavan, "Sequential diagnosability is co-NP complete," IEEE Trans. Comput., vol. 40, pp. 584-595, 1991.
19. J. D. Russell and C. R. Kime, "System fault diagnosis: masking exposure and diagnosability without repair," IEEE Trans. Comput., vol. 24, pp. 1155-1161, 1975.
20. G. Sullivan, "A polynomial time algorithm for fault diagnosability," in 17th Fault-Tolerant Computing Symp., Pittsburgh, PA, 1987, pp. 148-156.
21. H. Wang et al., "Analysis and experimental evaluation of comparison-based system-level diagnosis for multiprocessor systems," in 24th Fault Tolerant Computing Symp., Austin, TX, June 1994, pp. 55-64.