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Volumn 27, Issue 4, 2004, Pages 668-675

A procedure for validating the finite element model of a piezoresistive ceramic pressure sensor

Author keywords

Ceramic pressure sensors (CPSs); Device under test (DUT); Finite element (FE) model

Indexed keywords

COMPUTER SIMULATION; DESIGN FOR TESTABILITY; ELECTROMECHANICAL DEVICES; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; RELIABILITY; RESISTORS; SENSORS; THICK FILM DEVICES;

EID: 10244232785     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2004.838869     Document Type: Article
Times cited : (14)

References (7)
  • 1
    • 0012006230 scopus 로고    scopus 로고
    • "Multilayer ceramic microsystems technology - An overview"
    • Strasbourg, France
    • D. L. Wilcox, "Multilayer ceramic microsystems technology - An overview," in Proc. 13th Eur. Microelectronics Packaging Conf., Strasbourg, France, 2001, pp. 115-117.
    • (2001) Proc. 13th Eur. Microelectronics Packaging Conf. , pp. 115-117
    • Wilcox, D.L.1
  • 5
    • 3843085277 scopus 로고    scopus 로고
    • "Virtual thermo-mechanical prototyping of the ceramic pressure sensor"
    • Cracow, Poland, June
    • D. Belavič, K. P. Friedel, A. Wymyslowski, and M. S. Zarnik, "Virtual thermo-mechanical prototyping of the ceramic pressure sensor," in Proc. Symp. IMAPS-Europe, Cracow, Poland, June 2002, pp. 369-374.
    • (2002) Proc. Symp. IMAPS-Europe , pp. 369-374
    • Belavič, D.1    Friedel, K.P.2    Wymyslowski, A.3    Zarnik, M.S.4
  • 6
    • 0004307666 scopus 로고    scopus 로고
    • "Gauge factorof thick-film resistors: Outcomes of the variable-range-hopping model"
    • C. Grimaldi, P. Ryser, and S. Strassler, "Gauge factorof thick-film resistors: Outcomes of the variable-range-hopping model," J. Appl. Phys., vol. 88, no. 7, pp. 4164-4169, 2000.
    • (2000) J. Appl. Phys. , vol.88 , Issue.7 , pp. 4164-4169
    • Grimaldi, C.1    Ryser, P.2    Strassler, S.3
  • 7
    • 0036523454 scopus 로고    scopus 로고
    • "The application of finite element analysis, in the design of thick-film hybrid circuits"
    • M. S. Zarnik, "The application of finite element analysis, in the design of thick-film hybrid circuits," Inform. Midem, vol. 32, no 1, pp. 14-21, 2002.
    • (2002) Inform. Midem , vol.32 , Issue.1 , pp. 14-21
    • Zarnik, M.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.