Combined k-out-of-n:G, and consecutive kc-out-of-n:G systems

IEEE Transactions on Reliability

Volumn 53, Issue 4, 2004, Pages 523-531

  Gera, Amos Eliahu ^a  

^a Elta Electronics Industries Ltd   (Israel)

Author keywords

Consecutive k out of n:G; Degradation; Dependent tests; K out of n:G; Mean time to failure; Qualification tests; Reliability

Indexed keywords

BOUNDARY CONDITIONS; COMBINATORIAL MATHEMATICS; PROBABILITY; STATISTICAL TESTS; SYSTEMS ANALYSIS;

DEPENDENT TESTS; MEAN TIME TO FAILURE; QUALIFICATION TESTS;

RELIABILITY THEORY;

EID: 10244226667     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2004.837524     Document Type: Article

References (13)

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