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Volumn 26, Issue 6, 2004, Pages 265-269

Improved depth of field in the scanning electron microscope derived from through-focus image stacks

Author keywords

Bone; Cartilage; Osteoporosis; Scanning electron microscope; Three dimensional imaging

Indexed keywords

BACKSCATTERING; COLOR CODES; ELECTRONS; IMAGE ANALYSIS; LIGHTING; OPTICAL MICROSCOPY;

EID: 10144257874     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950260602     Document Type: Article
Times cited : (10)

References (2)
  • 1
    • 0002598077 scopus 로고
    • Mapping and measuring surfaces using reflection confocal microscopy
    • (Ed. Pawley JB). Plenum Press, New York
    • Boyde A, Jones SJ: Mapping and measuring surfaces using reflection confocal microscopy. In Handbook of Biological Confocal Microscopy, 2nd ed. (Ed. Pawley JB). Plenum Press, New York (1995) 255-266
    • (1995) Handbook of Biological Confocal Microscopy, 2nd Ed. , pp. 255-266
    • Boyde, A.1    Jones, S.J.2
  • 2
    • 0037322138 scopus 로고    scopus 로고
    • Improved digital SEM of cancellous bone: Scanning direction of detection, through focus for in-focus and sample orientation
    • Boyde A: Improved digital SEM of cancellous bone: Scanning direction of detection, through focus for in-focus and sample orientation. J Anat 202, 183-194 (2003)
    • (2003) J Anat , vol.202 , pp. 183-194
    • Boyde, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.