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Volumn 26, Issue 6, 2004, Pages 265-269
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Improved depth of field in the scanning electron microscope derived from through-focus image stacks
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Author keywords
Bone; Cartilage; Osteoporosis; Scanning electron microscope; Three dimensional imaging
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Indexed keywords
BACKSCATTERING;
COLOR CODES;
ELECTRONS;
IMAGE ANALYSIS;
LIGHTING;
OPTICAL MICROSCOPY;
BACKSCATTERED ELECTRON (BSE);
CONTOUR MAP FUNCTION;
HUMAN OSTEOPOROTIC BONE;
IMAGE STACKS;
MAGNIFICATION;
MECHANICAL Z-AXIS MOVEMENT;
SCANNING ELECTRON MICROSCOPY;
ARTICLE;
COMPUTER PROGRAM;
CONFOCAL MICROSCOPY;
IMAGING;
OSTEOPOROSIS;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPE;
COLOR CODES;
ILLUMINATION;
IMAGE ANALYSIS;
SCANNING ELECTRON MICROSCOPY;
SCATTERING;
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EID: 10144257874
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950260602 Document Type: Article |
Times cited : (10)
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References (2)
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