Use of the Rietveld refinement method for the preparation of pure lead hexaferrite

Materials Letters

Volumn 59, Issue 5, 2005, Pages 591-594

  Palomares Sanchez, S A ^a   Diaz Castanon, S ^b   Ponce Castaneda S ^c   Mirabal Garcia M ^a   Leccabue, F ^d   Watts, B E ^d  

^a UNIVERSIDAD AUTÓNOMA DE SAN LUIS POTOSÍ   (Mexico)

^b UNIVERSITY OF HAVANA   (Cuba)

^c Autonomous University San Luis Potosi   (Mexico)

^d IMEM CNR   (Italy)

Author keywords

Ceramics; Hexaferrites; Rietveld refinement; X ray diffraction

Indexed keywords

CALCINATION; CERAMIC MATERIALS; EVAPORATION; MAGNETOMETERS; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

HEXAFERRITES; RIETVELD REFINEMENT; ROOM TEMPERATURE (RT); VIBRATING SAMPLE MAGNETOMETER (VSM);

LEAD;

EID: 10144229386     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2004.11.002     Document Type: Article

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