Characterization of nanoparticles fabricated by oxidation of Ni 80Fe20 and Co80Fe20 thin films during imidization

Journal of Physical Chemistry B

Volumn 108, Issue 47, 2004, Pages 18179-18184

  Lim, Sung K ^a   Yoon, Chong S ^a   Kim, Chang K ^a   Kim, Young H ^a  

^a Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; DECOMPOSITION; ERROR ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GIBBS FREE ENERGY; GRAIN BOUNDARIES; MAGNETIC STORAGE; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; NICKEL COMPOUNDS; PARTICLE SIZE ANALYSIS; POLYIMIDES; SQUIDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

DIFFRACTION PATTERNS; IMIDIZATION; NANOPARTICLES; POLYMER MATRICES;

THIN FILMS;

EID: 10044298595     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0468758     Document Type: Article

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