Eigenphases vs. eigenfaces

Proceedings - International Conference on Pattern Recognition

Volumn 3, Issue , 2004, Pages 810-813

  Savvides, Marios ^a   Kumar, B V K Vijaya ^a   Khosla, P K ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENFACES; ILLUMINATION SUBSPACE; PARTIAL FACE RECOGNITION; PHASE INFORMATION;

EIGENVALUES AND EIGENFUNCTIONS; FOURIER TRANSFORMS; ILLUMINATING ENGINEERING; IMAGE ANALYSIS; PRINCIPAL COMPONENT ANALYSIS;

FACE RECOGNITION;

EID: 10044298414     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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