InP-based multi-wavelength QWIP technology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5406, Issue PART 2, 2004, Pages 589-599

  Fathimulla, Ayub ^b   Hier, Harry ^b   Aina, Leye ^b   Uppal, Parvez ^a  

^a BAE SYSTEMS   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

FOCAL PLANE ARRAYS; INP-BASED MATERIAL SYSTEMS; QUANTUM WELL INFRARED PHOTO DETECTORS (QWIP); WAVELENGTH;

COSTS; IMAGING SYSTEMS; MATERIALS SCIENCE; NETWORKS (CIRCUITS); PHOTOCURRENTS; RADIATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SILICON; SYSTEMS ANALYSIS; THERMAL CONDUCTIVITY;

PHOTODETECTORS;

EID: 10044295063     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.542366     Document Type: Conference Paper

References (12)

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