Performance limits of uncooled VO X microbolometer focal plane arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5406, Issue PART 2, 2004, Pages 447-453

  Kohin, Margaret ^a   Butler, Neal ^a  

^a BAE SYSTEMS   (United States)

Author keywords

And Performance; Infrared; Microbolometer; Uncooled

Indexed keywords

BOLOMETER BRIDGE; MICROMACHINING TECHNIQUES; TEMPERATURE COEFFICIENT OF RESISTANCE (TCR); UNCOOLED VOX MICROBOLOMETERS FOCAL PLANE ARRAYS (FPA);

ARRAYS; CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; HIGH TEMPERATURE EFFECTS; IMAGING SYSTEMS; INTEGRATED CIRCUITS; SCANNING ELECTRON MICROSCOPY; THERMOGRAPHY (IMAGING);

BOLOMETERS;

EID: 10044275465     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.542482     Document Type: Conference Paper

References (4)

1. A. Van Der Ziel, Flicker noise in electronic devices, Advances in Electronics and Electron Physics, v. 49, pp. 225-297, 1979.
2. R.F. Voss and J. Clarke, Flicker (1/f) noise: Equilibrium and resistance fluctuations. Physical Review B, v.13, #2, pp. 556-573, 1976.
3. nd Edition, J. Wiley and Sons, New York, 1981.
4. M.N., Gurnee, L. D. Kimball, Q. Hu, Characterization of VOx as a High Performance Microbolometer Detector, Military Sensing Symposium on Detectors, Tucson, AZ, February 2003.