Thin-zone TAP reactor as a basis of "state-by-state transient screening"

Chemical Engineering Science

Volumn 59, Issue 22-23, 2004, Pages 5493-5500

  Shekhtman, Sergiy O ^a   Yablonsky, Gregory S ^a   Gleaves, John T ^a   Fushimi, Rebecca R ^a  

^a WASHINGTON UNIVERSITY IN ST LOUIS   (United States)

Author keywords

Catalyst characterization; Kinetics; Pulse response; TAP experiment; Thin zone

Indexed keywords

CATALYSTS; MATHEMATICAL MODELS; REACTION KINETICS;

INDUSTRIAL CATALYSTS; KINETIC CHARACTERIZATION; TAP REACTORS;

ELECTRIC REACTORS;

CATALYSIS;

EID: 10044270996     PISSN: 00092509     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ces.2004.09.015     Document Type: Conference Paper

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