메뉴 건너뛰기




Volumn 10, Issue 6-7, 2004, Pages 493-497

Deep sub micron high aspect ratio polymer structures produced by hard X-ray lithography

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; IRRADIATION; SEMICONDUCTOR DEVICES; SUBSTRATES; SYNCHROTRON RADIATION; X RAY LITHOGRAPHY;

EID: 10044270017     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-004-0379-2     Document Type: Conference Paper
Times cited : (15)

References (13)
  • 1
    • 0002615662 scopus 로고    scopus 로고
    • Characterisation of defects in very high deep-etch X-ray lithography microstructures
    • Pantenburg FJ; Achenbach S; Mohr J (1998) Characterisation of defects in very high deep-etch X-ray lithography microstructures. Microsyst Tech 4(2): 89-94
    • (1998) Microsyst Tech , vol.4 , Issue.2 , pp. 89-94
    • Pantenburg, F.J.1    Achenbach, S.2    Mohr, J.3
  • 2
    • 26544437684 scopus 로고
    • Strong localization of photons in certain distorted dielectric superlattices
    • John S (1987) Strong localization of photons in certain distorted dielectric superlattices. Phys Rev Lett 58: 2486-2489
    • (1987) Phys Rev Lett , vol.58 , pp. 2486-2489
    • John, S.1
  • 3
    • 0035938390 scopus 로고    scopus 로고
    • Polymer photonic crystal slab waveguides
    • Liguda C; Böttger G; Eich M et al (2001) Polymer photonic crystal slab waveguides. Appl Phys Lett 78: 2434-2436
    • (2001) Appl Phys Lett , vol.78 , pp. 2434-2436
    • Liguda, C.1    Böttger, G.2    Eich, M.3
  • 4
    • 0000800104 scopus 로고
    • Application of X-ray lithography with a single-layer resist process to subquarter-micron large scale integrated circuit fabrication
    • Deguchi K; Miyoshi K et al (1992) Application of X-ray lithography with a single-layer resist process to subquarter-micron large scale integrated circuit fabrication. J Vac Sci Tech B 10(6): 3145-3149
    • (1992) J Vac Sci Tech B , vol.10 , Issue.6 , pp. 3145-3149
    • Deguchi, K.1    Miyoshi, K.2
  • 5
    • 0040113671 scopus 로고    scopus 로고
    • Direct measurement of X-ray mask sidewall roughness and its contribution on the overall sidewall roughness of chemically amplified resist features
    • Reynolds G; Taylor J (1999) Direct measurement of X-ray mask sidewall roughness and its contribution on the overall sidewall roughness of chemically amplified resist features. J Vac Sci Tech B 17(6): 3420-3425
    • (1999) J Vac Sci Tech B , vol.17 , Issue.6 , pp. 3420-3425
    • Reynolds, G.1    Taylor, J.2
  • 6
    • 0032674950 scopus 로고    scopus 로고
    • Sub-100 nm Imaging in X-ray lithography
    • Vladimirsky O; Leonard Q et al (1999) Sub-100 nm Imaging in X-ray Lithography. Proceeding of SPIE 3676: 478-484
    • (1999) Proceeding of SPIE , vol.3676 , pp. 478-484
    • Vladimirsky, O.1    Leonard, Q.2
  • 7
    • 0000710340 scopus 로고
    • Metal-less X-ray phase shift masks for nanolithography
    • White V; Cerrina F (1992) Metal-less X-ray phase shift masks for nanolithography. J Vac Sci Tech B 10(6): 3141-3144
    • (1992) J Vac Sci Tech B , vol.10 , Issue.6 , pp. 3141-3144
    • White, V.1    Cerrina, F.2
  • 10
    • 0000543565 scopus 로고    scopus 로고
    • Influence of developer temperature and resist material on the structure quality in deep X-ray lithography
    • Pantenburg FJ; Achenbach S; Mohr J (1998) Influence of developer temperature and resist material on the structure quality in deep X-ray lithography. J Vac Sci Tech B 16(6): 3547-3551
    • (1998) J Vac Sci Tech B , vol.16 , Issue.6 , pp. 3547-3551
    • Pantenburg, F.J.1    Achenbach, S.2    Mohr, J.3
  • 11
    • 0031382524 scopus 로고    scopus 로고
    • Calculation and experimental determination of the structure transfer accuracy in deep X-ray lithography
    • Feiertag G; Schmidt M et al (1997) Calculation and experimental determination of the structure transfer accuracy in deep X-ray lithography. J Micromech Microeng 7: 323-331
    • (1997) J Micromech Microeng , vol.7 , pp. 323-331
    • Feiertag, G.1    Schmidt, M.2
  • 12
    • 58149208670 scopus 로고
    • Influence of secondary effects on the structure quality in deep X-ray lithography
    • Pantenburg FJ; Mohr J (1995) Influence of secondary effects on the structure quality in deep X-ray lithography. NIM B 97: 551-556
    • (1995) NIM B , vol.97 , pp. 551-556
    • Pantenburg, F.J.1    Mohr, J.2
  • 13
    • 0037281909 scopus 로고    scopus 로고
    • Numerical simulation of heating and thermal distortions during exposure in deep X-ray lithography microstructures
    • Achenbach S; Pantenburg FJ; Mohr J (2003) Numerical simulation of heating and thermal distortions during exposure in deep X-ray lithography microstructures. Microsyst Tech 9(3): 220-224
    • (2003) Microsyst Tech , vol.9 , Issue.3 , pp. 220-224
    • Achenbach, S.1    Pantenburg, F.J.2    Mohr, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.