Picosecond time-resolved X-ray diffraction from laser-shocked semiconductors

Laser and Particle Beams

Volumn 22, Issue 3, 2004, Pages 285-288

  Nakamura, Kazutaka G ^a   Hironaka, Yoichiro ^a   Kawano, Hidetaka ^a   Kishimura, Hiroaki ^a   Kondo, Ken Ichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Femtoescond laser; Intense laser field; Laser plasma X rays; Semiconductors

Indexed keywords

AMPLIFIERS (ELECTRONIC); CAMERAS; CHARGE COUPLED DEVICES; PHASE TRANSITIONS; SEMICONDUCTOR MATERIALS; SHOCK WAVES; ULTRASHORT PULSES; X RAY DIFFRACTION ANALYSIS;

FEMTOSECOND LASER; INTENSE LASER FIELD; LASER PLASMA X RAYS; LASER-SHOCKED SEMICONDUCTORS;

LASER BEAMS;

EID: 10044267592     PISSN: 02630346     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0263034604223126     Document Type: Conference Paper

References (11)

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